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Semiconductors at a glance
HYPERION II by Bruker
FT-IR and IR laser imaging (QCL) microscope for research and development
Analyze macroscopic samples with microscopic resolution (5 µm) in seconds
Diffraction limited high sensitivity (FT-)IR microscopy and imaging at maximum speed ✓ Infrared laser imaging in all measurement modes (ATR, Transmission, Reflectance) ✓ Coherence reduction for artifact free Laser Imaging measurements without sensitivity or speed loss ✓
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