How to get rid of sieve analysis?

Dynamic Image Analysis (DIA) has become a widely used method for routine analysis of particle size and shape in many industries.

In this white paper we explain how traditional sieve analysis can be successfully replaced by DIA. The results of both methods for different materials with various particle shapes can be harmonized so that the product specifications based on sieve analysis remain unchanged.

Users of image analysis benefit from less work, higher sample throughput and more detailed results.