PANalytical becomes distributor for OBLF product line
11-Jan-2013
- Netherlands
PANalytical X-ray fluorescence (XRF) spectrometers and OBLF optical emission spectrometers (OES) perform complementary roles in the analysis of solid metals. When deployed together, XRF and OES allow for the measurement of elements over concentration ranges from sub-ppm to 100% within seconds. This combination of speed and versatility makes XRF and OES ideal for laboratories where metals analysis is a primary task.
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Malvern Panalytical
OBLF für Elektronik und Feinwerktechnik
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