Malvern launches new generation image analysis system for particle shape measurement

07-Mar-2005

Malvern Instruments has launched a new generation image analysis system for the fully automated characterization of particle shape and size. particle shape analysis has become a critical parameter in many industrial processes. This has fuelled a demand for increasingly flexible analytical systems that can be used in a variety of different circumstances to provide maximum shape and size information quickly and easily.

Key amongst the new features of the Sysmex FPIA-3000 is its ability to measure across a wide particle size range. The standard instrument configuration allows the characterization of particles from 1.5 to 160 microns. High and low magnification options cover the ranges 0.8 to 80 microns and 12 to 300 microns respectively. Sample volumes as low as 0.5 ml can be used throughout and every single particle image is now stored for future reference and analysis. New software brings access to a whole range of new shape and size parameters not previously available, as well as improved threshold control that allows more sensitive edge detection for transparent particles.

The Sysmex FPIA-3000 measures particles suspended in aqueous and non-aqueous liquid media. Using a CCD camera, the system produces images of each suspended particle. Samples pass through a sheath flow cell that transforms the particle suspension into a narrow, flat flow, ensuring that the largest area of the particle is oriented towards the camera and that all particles are in focus.

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Particle analysis methods allow us to study tiny particles in various materials and reveal their properties. Whether in environmental monitoring, nanotechnology or the pharmaceutical industry, particle analysis gives us a glimpse into a hidden world where we can decipher the composition, size and shape of particles. Experience the fascinating world of particle analysis!

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